Modeling and Testing of Ethernet Transformers
| Title | Modeling and Testing of Ethernet Transformers |
| Publication Type | Journal Articles |
| Year of Publication | 2009 |
| Authors | Bowen D, Mayergoyz ID, Zhang Z, McAvoy P, Krafft C, Kroop D |
| Journal | Magnetics, IEEE Transactions on |
| Volume | 45 |
| Issue | 10 |
| Pagination | 4793 - 4796 |
| Date Published | 2009/10// |
| ISBN Number | 0018-9464 |
| Keywords | area, capacitance;differential-mode, characteristic;local, Ethernet, identification;lumped, inductances;lumped, networks;transformers;, PARAMETERS, phenomena;transformers, signals;leakage, testing;resonance, transfer, transformers;cross-winding |
| Abstract | In this paper, novel techniques for the testing and identification of lumped parameters of equivalent circuits for Ethernet transformers are presented. It is demonstrated experimentally and theoretically that resonance phenomena may occur in the loop formed by leakage inductances and cross-winding capacitance. This resonance may corrupt the pass band of the transformers transfer characteristic for differential-mode signals. |
| DOI | 10.1109/TMAG.2009.2023918 |